Oct 10 2024 4 mins 2
In this podcast episode, MRS Bulletin’s Laura Leay interviews Michael Pettes, deputy group leader and staff scientist at the Center for Integrated Nanotechnologies in Los Alamos National laboratory about a characterization technique that employs a four-dimensional scanning transmission electron microscope (4D-STEM) paired with complex computational data analysis to directly measure the thermal expansion coefficient (TEC) of monolayer epitaxial tungsten diselenide. The standard technique for directly measuring the TEC involves X-ray diffraction, but 2D materials are too thin. 4D-STEM uses a patterned electron probe which enables diffraction positions to be accurately mapped in real space. This method overcomes the challenges of indirect measurements and spatial resolution. This work was published in a recent issue of ACS Nano.
