How AI is optimizing the IC test process – Part 2


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Dec 13 2024 11 mins   1

Microchips are getting smaller, denser and more complex with

each passing year not only incurring increased costs, but greater manufacturing

challenges as well. To help drive the continued advancement of semiconductor

technology, the design and testing of these new chips must be ready to

accommodate AI and ML from the ground up.

In this podcast, host Spencer Acain is joined by Ron Press,

Senior Director of Technology Enablement at Siemens Digital Industries, looks

to the future of AI and ML in the chip design and verification process. Ron

explores the needs for cutting edge technology in a field as complex as IC

production, as well as the challenges of adopting that same technology into a

multi-billion-dollar industry.

In this episode you will learn:

·

What is analytical AI? (0:37)

·

Challenges of bringing AI into IC design and

test (4:48)

·

The need for cutting edge technology in leading

processes (6:36)